List of Publications - Bernd Laquai
A Flexible and Scaleable Methodology for Testing High Speed Source Synchronous Interfaces on ATE with Multiple Fixed Phase Capture and Compare
Laquai, B. Hua, M. Schulze, G. Braun, M.
Test Symposium, 2006. ETS '06. Eleventh IEEE European, 21-21 May 2006
Pages:97- 102
http://ieeexplore.ieee.org/Xplore
A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in SOC Devices
Laquai, B.
Test Conference, 2004. Proceedings. International , 24 Oct.-29 Oct. 2004
Pages:764 - 772
http://ieeexplore.ieee.org/Xplore
Spectral Error Density Analysis--A New Approach to Identify Jitter Sources in SOC Devices
Bernd Laquai
Article in Test & Measurement World, Feb 2004
Article in Wireless Week, Jan 2004
Pdf-version
Testing High Speed Serial IO Interfaces Based on Spectral Jitter Decomposition
Rainer Plitschka, Bernd Laquai
DesignCon2004 Feb. 2-5, 2004, Santa Clara CA USA
Pdf-version 1.8MB
Vectorless test: best bet for high-speed IO
Bernd Laquai
EE Times, October 24, 2003
doc-file
A Low-Cost Vectorless ATE-Channel Architecture for Testing High-Speed IO Signal Integrity in High Volume Manufacturing
Bernd Laquai, Ulrich Schoettmer
ITC Future of ATE workshop, Oct2-3, 2003 Charlotte, NC USA
pdf-file
A Cost Effective Method for Jitter Test of SerDes Devices in High Volume Production
Bernd Laquai, Robert Schneider
Microelectronics Magazin Taiwan, 2002,1;
pdf-file
Jitter testing for gigabit serial communication transceivers
Yi Cai; Laquai, B.; Luehman, K.;
Design & Test of Computers, IEEE , Volume: 19 , Issue: 1 , Jan.-Feb. 2002
Pages:66 - 74
http://ieeexplore.ieee.org/Xplore
Testing gigabit multilane SerDes interfaces with passive jitter injection filters
Laquai, B.; Yi Cai;
Test Conference, 2001. Proceedings. International , 30 Oct.-1 Nov. 2001
Pages:297 - 304
http://ieeexplore.ieee.org/Xplore
Boundary scan adaption for active substrate MCM-test
Werkmann, H.; Hofflinger, B.; Laquai, B.;
ASIC Conference and Exhibit, 1997. Proceedings., Tenth Annual IEEE International , 7-10 Sept. 1997
Pages:62 - 66
http://ieeexplore.ieee.org/Xplore
A production-oriented measurement method for fast and exhaustive Iddq tests
Laquai, B.; Richter, H.; Werkmann, H.;
European Design and Test Conference, 1997. ED&TC 97. Proceedings , 17-20 March 1997
Pages:279 - 286
http://ieeexplore.ieee.org/Xplore
Efficient smart substrates with test capabilities and on-line temperature monitoring
Werkmann, H.; Laquai, B.; Schwederski, T.;
Multi-Chip Module Conference, 1995. MCMC-95, Proceedings., 1995 IEEE , 31 Jan.-2 Feb. 1995
Pages:183 - 188
http://ieeexplore.ieee.org/Xplore
A new method and test structure for easy determination of femto-farad on-chip capacitances in a MOS process
Laquai, B.; Richter, H.; Hofflinger, B.;
Microelectronic Test Structures, 1992. ICMTS 1992. Proceedings of the 1992 International Conference on , 16-19 March 1992
Pages:62 - 66
http://ieeexplore.ieee.org/Xplore
Mixed static and domino logic on the CMOS gate forest
Kernhof, J.; Selzer, M.; Beunder, M.A.; Hoefflinger, B.; Laquai, B.; Schindler, I.;
Solid-State Circuits, IEEE Journal of , Volume: 25 , Issue: 2 , April 1990
Pages:396 - 402
http://ieeexplore.ieee.org/Xplore